VLSI Design and Test
Springer Verlag, Singapore, 2019
121,95 €On orderDelivery: 2-3 weeks
This book constitutes the refereed proceedings of the 23st International Symposium on VLSI Design and Test, VDAT 2019, held in Indore, India, in July 2019. The 63 full papers were carefully reviewed and selected from 199 submissions. The papers are organized in topical sections named: analog and mixed signal design;
- ISBN-13
- 9789813297661
- ISBN-10
- 9813297662
- Publisher
- Springer Verlag, Singapore
- Year
- 2019
- Publication date
- 2019-08-18
- Pages
- 775
- Dimensions
- 234x159x45
- Weight
- 1212