Microstructural Characterisation Techniques
Gunturi Venkata Sitarama Sastry
Springer Verlag, Singapore, 2023
66,50 €On orderDelivery: 2-3 weeks
It comprehensively covers the topic of microstructural characterization and includes an emphasis on Fourier analysis and Fourier transformation, electron diffraction, electromagnetic waves and electron waves, lens parameters, transmission electron microscopy, optical microscopy and scanning electron microscopy.
- ISBN-13
- 9789811935114
- ISBN-10
- 9811935114
- Publisher
- Springer Verlag, Singapore
- Year
- 2023
- Publication date
- 2023-09-17
- Pages
- 242
- Dimensions
- 235x155x