VLSI Design and Test
Springer Verlag, Singapore, 2019
121,95 €On orderDelivery: 2-3 weeks
This book constitutes the refereed proceedings of the 22st International Symposium on VLSI Design and Test, VDAT 2018, held in Madurai, India, in June 2018. The 39 full papers and 11 short papers presented together with 8 poster papers were carefully reviewed and selected from 231 submissions.
- ISBN-13
- 9789811359491
- ISBN-10
- 9811359490
- Publisher
- Springer Verlag, Singapore
- Year
- 2019
- Publication date
- 2019-01-25
- Pages
- 722
- Dimensions
- 237x176x47
- Weight
- 1070