Test Generation of Crosstalk Delay Faults in VLSI Circuits
M.C. Bhuvaneswari, S. Jayanthy
Springer Verlag, Singapore, 2018
158,95 €On orderDelivery: 2-3 weeks
The book begins with a focus on currently available crosstalk delay models, test generation algorithms for delay faults and crosstalk delay faults, before moving on to deterministic algorithms and simulation-based algorithms used to test crosstalk delay faults.
- ISBN-13
- 9789811347849
- ISBN-10
- 9811347840
- Publisher
- Springer Verlag, Singapore
- Year
- 2018
- Publication date
- 2018-12-21
- Pages
- 156
- Dimensions
- 235x155x