Progress in Nanoscale Characterization and Manipulation
Springer Verlag, Singapore, 2019
133,25 €On orderDelivery: 2-3 weeks
It showcases recent advances in scanning electron microscopy, transmission electron microscopy and helium ion microscopy, including advanced spectroscopy, spherical-corrected microscopy, focused-ion imaging and in-situ microscopy.
- ISBN-13
- 9789811344206
- ISBN-10
- 9811344205
- Publisher
- Springer Verlag, Singapore
- Year
- 2019
- Publication date
- 2019-01-11
- Pages
- 508
- Dimensions
- 235x330x30
- Weight
- 750