Progress in Nanoscale Characterization and Manipulation
Springer Verlag, Singapore, 2018
185,50 €On orderDelivery: 2-3 weeks
It showcases recent advances in scanning electron microscopy, transmission electron microscopy and helium ion microscopy, including advanced spectroscopy, spherical-corrected microscopy, focused-ion imaging and in-situ microscopy.
- ISBN-13
- 9789811304538
- ISBN-10
- 981130453X
- Publisher
- Springer Verlag, Singapore
- Year
- 2018
- Publication date
- 2018-09-14
- Pages
- 508
- Dimensions
- 235x155x