High-level Estimation and Exploration of Reliability for Multi-Processor System-on-Chip
Anupam Chattopadhyay, Zheng Wang
Springer Verlag, Singapore, 2018
121,95 €On orderDelivery: 2-3 weeks
This book introduces a novel framework for accurately modeling the errors in nanoscale CMOS technology and developing a smooth tool flow at high-level design abstractions to estimate and mitigate the effects of errors.
- ISBN-13
- 9789811093210
- ISBN-10
- 9811093210
- Publisher
- Springer Verlag, Singapore
- Year
- 2018
- Publication date
- 2018-05-12
- Pages
- 197
- Dimensions
- 235x155x