Novel Algorithms for Fast Statistical Analysis of Scaled Circuits

Amith Singhee, Rob A. Rutenbar

Springer, 2009

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Novel Algorithms for Fast Statistical Analysis of Scaled Circuits draws upon ideas for attacking parallel problems in other technical fields, such as computational finance, machine learning and actuarial risk, and synthesizes them with innovative attacks for the problem domain of integrated circuits.

ISBN-13
9789048130993
ISBN-10
9048130999
Publisher
Springer
Year
2009
Publication date
2009-08-10
Pages
195
Dimensions
235x155x