On-Wafer Calibration Techniques Enabling Accurate Characterization of High-Performance Silicon Devices at the mm-Wave Range and Beyond
Andrej Rumiantsev
River Publishers, 2019
146,95 €On orderDelivery: 2-3 weeks
This book presents solutions for accurate mm-wave characterization of advanced semiconductor devices. It guides through the process of development, implementation and verification of the in-situ calibration methods optimized for high-performance silicon technologies.
- ISBN-13
- 9788770221122
- ISBN-10
- 877022112X
- Publisher
- River Publishers
- Year
- 2019
- Publication date
- 2019-07-31
- Pages
- 278
- Dimensions
- 234x156x
- Weight
- 526