High-Resolution Electron Microscopy for Materials Science
Daisuke Shindo, Hiraga Kenji
Springer Verlag, Japan, 1998
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Essential information on appropriate imaging conditions for observing lattice images and structure images is presented, and methods for extracting structural information from these observations are clearly shown, including examples in advanced materials.
- ISBN-13
- 9784431702344
- ISBN-10
- 4431702342
- Publisher
- Springer Verlag, Japan
- Year
- 1998
- Publication date
- 1998-09-01
- Pages
- 190
- Dimensions
- 210x279x16
- Weight
- 516