Transmission Electron Microscopy and Diffractometry of Materials
Brent Fultz, Howe, James
Springer-Verlag Berlin and Heidelberg GmbH & Co. KG, 2012
145,75 €On orderDelivery: 2-3 weeks
This book explains concepts of transmission electron microscopy (TEM) and x-ray diffractometry (XRD) that are important for the characterization of materials.
- ISBN-13
- 9783642297601
- ISBN-10
- 3642297609
- Publisher
- Springer-Verlag Berlin and Heidelberg GmbH & Co. KG
- Year
- 2012
- Publication date
- 2012-10-14
- Pages
- 764
- Dimensions
- 235x155x