Auger- and X-Ray Photoelectron Spectroscopy in Materials Science
Siegfried Hofmann
Springer-Verlag Berlin and Heidelberg GmbH & Co. KG, 2012
330,50 €On orderDelivery: 2-3 weeks
Key chapters are those on quantitative surface analysis and on quantitative depth profiling, including recent developments in topics such as surface excitation parameter and backscattering correction factor.
- ISBN-13
- 9783642273803
- ISBN-10
- 3642273807
- Publisher
- Springer-Verlag Berlin and Heidelberg GmbH & Co. KG
- Year
- 2012
- Publication date
- 2012-10-25
- Pages
- 528
- Dimensions
- 241x161x34
- Weight
- 940