Introduction to Spectroscopic Ellipsometry of Thin Film Materials
Andrew T. S. (National University of Singapore, Singapore) Wee, Chi Sin (Institute of Materials Research and Engineering, Agency for Science Technology and Research (A*STAR), Singapore) Tang, Xinmao (Shanghai University, China) Yin
Wiley-VCH Verlag GmbH, 2022
112,95 €On orderDelivery: 2-3 weeks
- ISBN-13
- 9783527349517
- ISBN-10
- 3527349510
- Publisher
- Wiley-VCH Verlag GmbH
- Year
- 2022
- Publication date
- 2022-04-13
- Pages
- 208
- Dimensions
- 173x246x11
- Weight
- 410