Helium Ion Microscopy
Springer International Publishing AG, 2018
264,50 €On orderDelivery: 2-3 weeks
This book covers the fundamentals of Helium Ion Microscopy (HIM) including the Gas Field Ion Source (GFIS), column and contrast formation. The expert reader will find a complete reference of the technique covering all important applications in several chapters written by the leading experts in the field.
- ISBN-13
- 9783319824734
- ISBN-10
- 3319824732
- Publisher
- Springer International Publishing AG
- Year
- 2018
- Publication date
- 2018-06-16
- Pages
- 526
- Dimensions
- 234x156x32
- Weight
- 814