Nanotechnology: Principles and Practices
Sulabha K. Kulkarni
Springer International Publishing AG, 2014
110,50 €On orderDelivery: 2-3 weeks
The book also explains the functional principles of essential techniques, such as scanning tunneling microscopy (STM), atomic force microscopy (AFM), scanning near field optical microscopy (SNOM), Raman spectroscopy and photoelectron microscopy.
- ISBN-13
- 9783319091709
- ISBN-10
- 3319091700
- Publisher
- Springer International Publishing AG
- Year
- 2014
- Publication date
- 2014-11-17
- Pages
- 403
- Dimensions
- 235x155x