Yield-Aware Analog IC Design and Optimization in Nanometer-scale Technologies
Antonio Manuel Lourenco Canelas, Jorge Manuel Correia Guilherme, Nuno Cavaco Gomes Horta
Springer Nature Switzerland AG, 2020
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This book presents a new methodology with reduced time impact to address the problem of analog integrated circuit (IC) yield estimation by means of Monte Carlo (MC) analysis, inside an optimization loop of a population-based algorithm.
- ISBN-13
- 9783030415358
- ISBN-10
- 303041535X
- Publisher
- Springer Nature Switzerland AG
- Year
- 2020
- Publication date
- 2020-03-21
- Pages
- 237
- Dimensions
- 235x155x