Noise in Nanoscale Semiconductor Devices

Springer Nature Switzerland AG, 2020

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III-V materials, 2D materials, and multi-state defects. Describes the state-of-the-art, regarding noise in nanometer semiconductor devices;Enables readers to design more reliable semiconductor devices;Offers the most up-to-date information on point defects, based on physical microscopic models.

ISBN-13
9783030374990
ISBN-10
3030374998
Publisher
Springer Nature Switzerland AG
Year
2020
Publication date
2020-04-27
Pages
729
Dimensions
235x155x