Multi-run Memory Tests for Pattern Sensitive Faults
Ireneusz Mrozek
Springer Nature Switzerland AG, 2019
66,50 €On orderDelivery: 2-3 weeks
This book describes efficient techniques for production testing as well as for periodic maintenance testing (specifically in terms of multi-cell faults) in modern semiconductor memory.
- ISBN-13
- 9783030081980
- ISBN-10
- 3030081982
- Publisher
- Springer Nature Switzerland AG
- Year
- 2019
- Publication date
- 2019-02-01
- Pages
- 135
- Dimensions
- 235x155x