X-ray Scattering From Semiconductors (2nd Edition)
Paul F (Panalytical Research, Uk) Fewster
Imperial College Press, 2003
164,25 €On orderDelivery: 2-3 weeks
A practical guide to the analysis of materials, including a description of the underlying theories and instrumental aberrations caused by real experiments. The main emphasis concerns the analysis of thin films and multilayers, primarily semiconductors, although the techniques are very general.
- ISBN-13
- 9781860943607
- ISBN-10
- 1860943608
- Publisher
- Imperial College Press
- Year
- 2003
- Publication date
- 2003-07-08
- Pages
- 316