Aberration-corrected Imaging In Transmission Electron Microscopy: An Introduction (2nd Edition)
Rolf (Swiss Federal Labs For Materials Science & Technology (Empa), Switzerland) Erni
Imperial College Press, 2015
123,25 €On orderDelivery: 2-3 weeks
Aberration-Corrected Imaging in Transmission Electron Microscopy provides an introduction to aberration-corrected atomic-resolution electron microscopy imaging in materials and physical sciences.
- ISBN-13
- 9781783265282
- ISBN-10
- 1783265280
- Publisher
- Imperial College Press
- Year
- 2015
- Publication date
- 2015-05-18
- Pages
- 432
- Dimensions
- 238x160x23
- Weight
- 802