Design and Analysis of Accelerated Tests for Mission Critical Reliability
Bruce G. LeFevre, Michael J. LuValle, SirRaman Kannan
Taylor & Francis Inc, 2004
106,50 €On orderDelivery: 2-3 weeks
Presents theory and methods for recognizing and handling the more complicated cases often encountered in practice. This work integrates a physical understanding of underlying phenomena and the statistical modeling of observation 'noise' to provide a single theoretical framework for accelerated testing.
- ISBN-13
- 9781584884712
- ISBN-10
- 1584884711
- Publisher
- Taylor & Francis Inc
- Year
- 2004
- Publication date
- 2004-04-27
- Pages
- 248
- Dimensions
- 234x156x
- Weight
- 476