Microprobe Characterization of Optoelectronic Materials
Juan (University of Valladolid, Spain) Jimenez
Taylor & Francis Inc, 2002
791,95 €On orderDelivery: 2-3 weeks
Discusses microprobe technique and its usefulness as diagnostic technique for device degradation. This book considers various types of probes (electrons, photons and tips) and different microscopes (optical, electron microscopy and tunneling). It is suitable for researchers, crystal growers and optoelectronic device makers.
- ISBN-13
- 9781560329411
- ISBN-10
- 1560329416
- Publisher
- Taylor & Francis Inc
- Year
- 2002
- Publication date
- 2002-11-15
- Pages
- 730
- Dimensions
- 229x152x
- Weight
- 1111