Local Electrode Atom Probe Tomography
Brian P. Geiser, David J. Larson, Robert M. Ulfig, Thomas F. Kelly, Ty J. Prosa
Springer-Verlag New York Inc., 2016
267,25 €On orderDelivery: 2-3 weeks
Coverage is both comprehensive and user friendly, including the fundamentals of preparing specimens for the microscope from a variety of materials, the details of the instrumentation used in data collection, the parameters under which optimal data are collected, the current methods of data reconstruction, and selected methods of data analysis.
- ISBN-13
- 9781493952434
- ISBN-10
- 1493952439
- Publisher
- Springer-Verlag New York Inc.
- Year
- 2016
- Publication date
- 2016-08-27
- Pages
- 318
- Dimensions
- 155x233x22
- Weight
- 560