Atom Probe Microscopy
Baptiste Gault, Julie M. Cairney, Michael P. Moody, Simon P. Ringer
Springer-Verlag New York Inc., 2014
324,50 €On orderDelivery: 2-3 weeks
This book covers all facets of atom probe microscopy—including field ion microscopy, field desorption microscopy and a strong emphasis on atom probe tomography. Atom Probe Microscopy is aimed at researchers of all experience levels.
- ISBN-13
- 9781489989390
- ISBN-10
- 1489989390
- Publisher
- Springer-Verlag New York Inc.
- Year
- 2014
- Publication date
- 2014-06-11
- Pages
- 396
- Dimensions
- 155x233x28
- Weight
- 646