Electron Energy-Loss Spectroscopy in the Electron Microscope

R.F. Egerton

Springer-Verlag New York Inc., 2014

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Within the last 30 years, electron energy-loss spectroscopy (EELS) has become a standard analytical technique used in the transmission electron microscope to extract chemical and structural information down to the atomic level.

ISBN-13
9781489986498
ISBN-10
1489986499
Publisher
Springer-Verlag New York Inc.
Year
2014
Publication date
2014-10-01
Pages
491
Dimensions
154x235x34
Weight
750