Atom-Probe Tomography
Michael K. Miller, Richard G. Forbes
Springer-Verlag New York Inc., 2014
172,25 €On orderDelivery: 2-3 weeks
Nanocharacterization by Atom Probe Tomography is a practical guide for researchers interested atomic level characterization of materials with atom probe tomography. Readers will find descriptions of the atom probe instrument and atom probe tomography technique, field ionization, field evaporation and field ion microscopy.
- ISBN-13
- 9781489974297
- ISBN-10
- 1489974296
- Publisher
- Springer-Verlag New York Inc.
- Year
- 2014
- Publication date
- 2014-08-02
- Pages
- 423
- Dimensions
- 242x163x23
- Weight
- 766