Electron Energy-Loss Spectroscopy in the Electron Microscope
R.F. Egerton
Springer-Verlag New York Inc., 2011
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Within the last 30 years, electron energy-loss spectroscopy (EELS) has become a standard analytical technique used in the transmission electron microscope to extract chemical and structural information down to the atomic level.
- ISBN-13
- 9781441995827
- ISBN-10
- 144199582X
- Publisher
- Springer-Verlag New York Inc.
- Year
- 2011
- Publication date
- 2011-07-29
- Pages
- 491
- Dimensions
- 235x155x