Ion Beam Analysis

James W. Mayer, Michael Nastasi, Yongqiang Wang

Taylor & Francis Inc, 2014

317,25 €On orderDelivery: 2-3 weeks

This book explains the basic characteristics of ion beams as applied to the analysis of materials, as well as IBA of art/archaeological objects. It focuses on the fundamentals and applications of ion beam methods of materials characterization. It starts with coverage of the fundamentals of ion beam analysis, including kinematics, ion stopping, R

ISBN-13
9781439846384
ISBN-10
1439846383
Publisher
Taylor & Francis Inc
Year
2014
Publication date
2014-08-27
Pages
472
Dimensions
240x157x31
Weight
802