Testing for Small-Delay Defects in Nanoscale CMOS Integrated Circuits

Name: Testing for Small-Delay Defects in Nanoscale CMOS Integrated Circuits
Price: 354.95 EUR
Availability: BackOrder
ISBN: 9781439829417

Taylor & Francis Inc, 2013

354,95 €On orderDelivery: 2-3 weeks

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ISBN-13: 9781439829417
ISBN-10: 1439829411
Publisher: Taylor & Francis Inc
Year: 2013
Publication date: 2013-10-25
Pages: 259
Dimensions: 238x175x22
Weight: 598