Measurement and Modeling of Silicon Heterostructure Devices
John D. (Georgia Institute of Technology, Atlanta, USA) Cressler
Taylor & Francis Inc, 2007
283,95 €On orderDelivery: 2-3 weeks
Focuses on measurement and modeling of high-speed conductor devices. This book provides experience-based tricks of the trade and the subtle nuances of measuring and modeling. It covers topics including compact modeling using integrated CAD tools and design kits, noise mitigation approaches, Germanium RF designs, and, transmission lines.
- ISBN-13
- 9781420066920
- ISBN-10
- 1420066927
- Publisher
- Taylor & Francis Inc
- Year
- 2007
- Publication date
- 2007-12-13
- Pages
- 198
- Dimensions
- 189x264x20
- Weight
- 522