Defects in Microelectronic Materials and Devices
Taylor & Francis Inc, 2008
317,25 €On orderDelivery: 2-3 weeks
Presents a survey of defects that occur in silicon-based metal-oxide semiconductor field-effect transistor (MOSFET) technologies. This book discusses flaws in linear bipolar technologies, silicon carbide-based devices, and gallium arsenide materials and devices.
- ISBN-13
- 9781420043761
- ISBN-10
- 1420043765
- Publisher
- Taylor & Francis Inc
- Year
- 2008
- Publication date
- 2008-11-19
- Pages
- 770
- Dimensions
- 260x185x42
- Weight
- 1520