Functional Design Errors in Digital Circuits
Igor L. Markov, Kai-hui Chang, Valeria Bertacco
Springer-Verlag New York Inc., 2008
172,25 €On orderDelivery: 2-3 weeks
Functional Design Errors in Digital Circuits Diagnosis covers a wide spectrum of innovative methods to automate the debugging process throughout the design flow: from Register-Transfer Level (RTL) all the way to the silicon die. (2) an RTL error diagnosis method that identifies the root cause of errors directly;
- ISBN-13
- 9781402093647
- ISBN-10
- 1402093640
- Publisher
- Springer-Verlag New York Inc.
- Year
- 2008
- Publication date
- 2008-12-10
- Pages
- 200
- Dimensions
- 161x246x18
- Weight
- 466