Semiconductor Laser Engineering, Reliability and Diagnostics
Peter W. (Pwe-PhotonicsElectronics-IssueResolution; University of Stuttgart, Germany) Epperlein
John Wiley & Sons Inc, 2013
139,25 €On orderDelivery: 2-3 weeks
This reference book provides a fully integrated novel approach to the development of high-power, single-transverse mode, edge-emitting diode lasers by addressing the complementary topics of device engineering, reliability engineering and device diagnostics in the same book, and thus closes the gap in the current book literature.
- ISBN-13
- 9781119990338
- ISBN-10
- 1119990335
- Publisher
- John Wiley & Sons Inc
- Year
- 2013
- Publication date
- 2013-02-22
- Pages
- 520
- Dimensions
- 236x160x38
- Weight
- 771