Total-Reflection X-Ray Fluorescence Analysis and Related Methods
Alex von Bohlen, Reinhold Klockenkamper
John Wiley & Sons Inc, 2015
170,25 €On orderDelivery: 2-3 weeks
Providing an accessible introduction into the use of Total-Reflection X-ray Fluorescence (TXRF) Analysis, both from a theoretical point of view and for practical applications, this new edition of Total-Reflection X-Ray Fluorescence Analysis is completely updated and enlarged to emphasize new methods and techniques.
- ISBN-13
- 9781118460276
- ISBN-10
- 1118460278
- Publisher
- John Wiley & Sons Inc
- Year
- 2015
- Publication date
- 2015-03-20
- Pages
- 552
- Dimensions
- 244x163x34
- Weight
- 889