VLSI Fault Modeling and Testing Techniques
Bloomsbury Publishing Plc, 1993
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This text explores VLSI fault modelling and testing techniques and covers such topics as: physical fault modelling and simulation for VSLI MOS circuits; designing CMOS gates to test open faults; testing bridging faults in VLSI; and testable design synthesis models.
- ISBN-13
- 9780893917814
- ISBN-10
- 0893917818
- Publisher
- Bloomsbury Publishing Plc
- Year
- 1993
- Publication date
- 1993-05-01
- Pages
- 200