High Resolution X-Ray Diffractometry And Topography
Brian K. Tanner, D.K. Bowen
Taylor & Francis Ltd, 1998
317,25 €On orderDelivery: 2-3 weeks
The application of electronic materials has created a demand for reliable techniques for examining these materials. This book looks at the area of x-ray diffraction and the modern techniques available for deployment in research. It provides the background for applying these techniques.
- ISBN-13
- 9780850667585
- ISBN-10
- 0850667585
- Publisher
- Taylor & Francis Ltd
- Year
- 1998
- Publication date
- 1998-02-05
- Pages
- 262
- Dimensions
- 263x178x20
- Weight
- 656