Guidebook for Managing Silicon Chip Reliability
Gopal Rao, Michael Pecht, Riko Radojcic
Taylor & Francis Inc, 1998
189,25 €On orderDelivery: 2-3 weeks
Examines the principal failure mechanisms associated with modern integrated circuits and describes common practices used to resolve them. This book provides a framework for how to model the mechanism, test for defects, and avoid and manage damage.
- ISBN-13
- 9780849396243
- ISBN-10
- 0849396247
- Publisher
- Taylor & Francis Inc
- Year
- 1998
- Publication date
- 1998-12-29
- Pages
- 224
- Dimensions
- 234x156x
- Weight
- 489