Influence of Temperature on Microelectronics and System Reliability
Edward B. Hakim, Michael (University of Maryland, College Park, USA) Pecht, Pradeep (Auburn University, Alabama, USA) Lall
Taylor & Francis Inc, 1997
220,75 €On orderDelivery: 2-3 weeks
This book provides a sound scientific basis for achieving system operation without reliability penalties at realistic steady state temperatures. guidelines for thermal derating of microelectronic devices.
- ISBN-13
- 9780849394508
- ISBN-10
- 0849394503
- Publisher
- Taylor & Francis Inc
- Year
- 1997
- Publication date
- 1997-04-24
- Pages
- 328
- Dimensions
- 264x184x23
- Weight
- 794