Memory, Microprocessor, and ASIC
Taylor & Francis Inc, 2003
317,25 €On orderDelivery: 2-3 weeks
Timing, memory, power dissipation, testing, and testability are crucial elements of VLSI circuit design. This title treats stacked gate, embedded, and flash memory, including their power consumption and developments in low-power memories. It provides a chapter to deal with the topic of application-specific integrated circuits (ASICs).
- ISBN-13
- 9780849317378
- ISBN-10
- 0849317371
- Publisher
- Taylor & Francis Inc
- Year
- 2003
- Publication date
- 2003-03-26
- Pages
- 384
- Dimensions
- 186x261x27
- Weight
- 890