Quantitative X-Ray Spectrometry
Ron Jenkins
Taylor & Francis Inc, 1995
475,50 €On orderDelivery: 2-3 weeks
Covers important aspects of X-ray spectrometry, from basic principles to the selection of instrument parameters and sample preparation. This title explicates the use of combined X-ray fluorescence and X-ray diffraction data, and features fresh applications in environmental studies, forensic science, minerals and ore, and ceramic materials.
- ISBN-13
- 9780824795542
- ISBN-10
- 0824795547
- Publisher
- Taylor & Francis Inc
- Year
- 1995
- Publication date
- 1995-04-26
- Pages
- 504
- Dimensions
- 234x156x
- Weight
- 839