Integrated Circuit Quality and Reliability
Eugene R. (Encinitas, California, USA) Hnatek
Taylor & Francis Inc, 1994
317,25 €On orderDelivery: 2-3 weeks
Examines various aspects of integrated circuit design, fabrication, assembly and test processes as they relate to quality and reliability. This work discusses: circuit design technology trends; sources of error in wafer fabrication and assembly; avenues of contamination; IC packaging methods; and, in-line process monitors and test structures.
- ISBN-13
- 9780824792831
- ISBN-10
- 0824792831
- Publisher
- Taylor & Francis Inc
- Year
- 1994
- Publication date
- 1994-12-01
- Pages
- 808
- Dimensions
- 165x239x42
- Weight
- 1288