Speckle Metrology
Sirohi
Taylor & Francis Inc, 1993
633,75 €On orderDelivery: 2-3 weeks
Covers speckle metrology and its value as a measuring technique in industry. This book also surveys the origin of speckle displacement and decorrelation, presents procedures for deformation analysis and shape measurement of rough objects, and explains particle image velocimetry (PIV).
- ISBN-13
- 9780824789329
- ISBN-10
- 0824789326
- Publisher
- Taylor & Francis Inc
- Year
- 1993
- Publication date
- 1993-05-20
- Pages
- 572
- Dimensions
- 229x152x
- Weight
- 861