Characterisation of Radiation Damage by Transmission Electron Microscopy
M.A (Argonne National Laboratory, Illinois, USA) Kirk, M.L (University of Oxford, UK) Jenkins
Taylor & Francis Ltd, 2000
437,75 €On orderDelivery: 2-3 weeks
Details the electron microscopy methods used to investigate complex and fine-scale microstructures, such as those produced by fast-particle irradiation of metals or ion implantation of semiconductors. This book also focuses on the methods used to characterize small point-defect clusters, such as dislocation loops.
- ISBN-13
- 9780750307482
- ISBN-10
- 075030748X
- Publisher
- Taylor & Francis Ltd
- Year
- 2000
- Publication date
- 2000-11-21
- Pages
- 234
- Dimensions
- 234x156x
- Weight
- 540