Microscopy of Semiconducting Materials
Taylor & Francis Ltd, 2000
837,25 €On orderDelivery: 2-3 weeks
Presents an overview of advances in semiconductor studies using microscopy. This book explores the use of transmission and scanning electron microscopy, ultra fine electron probes, and EELS to investigate semi conducting structures. It is suitable for academics and researchers in materials science, and electrical and electronic engineering.
- ISBN-13
- 9780750306508
- ISBN-10
- 0750306505
- Publisher
- Taylor & Francis Ltd
- Year
- 2000
- Publication date
- 2000-01-01
- Pages
- 772
- Dimensions
- 234x156x
- Weight
- 1428