Topics in Electron Diffraction and Microscopy of Materials
Taylor & Francis Ltd, 1999
283,95 €On orderDelivery: 2-3 weeks
Offers an overview of applications for selected electron microscope techniques that have become widespread in their use for furthering our understanding of how materials behave. This work discusses topics including weak-beam techniques for problem solving, defect structures and dislocation interactions, and atomic level imaging applications.
- ISBN-13
- 9780750305389
- ISBN-10
- 075030538X
- Publisher
- Taylor & Francis Ltd
- Year
- 1999
- Publication date
- 1999-01-01
- Pages
- 208
- Dimensions
- 162x241x18
- Weight
- 432