D(X) Centres and other Metastable Defects in Semiconductors, Proceedings of the INT Symposium, Mauterndorf, Austria, 18-22 February 1991

Taylor & Francis Ltd, 1991

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D(X)-center and other metastability defects cause many technical problems that are exacerbated by the uncertainty and controversy surrounding the mechanisms that cause them. This book presents an investigation into these systems. It discusses topics such as the validity of negative or positive U models.

ISBN-13
9780750301534
ISBN-10
0750301538
Publisher
Taylor & Francis Ltd
Year
1991
Publication date
1991-01-01
Pages
164
Dimensions
280x210x
Weight
657