Electron Microscopy and Analysis
John (The University of Manchester, England, UK) Humphreys, Peter J. (University of Liverpool, England, UK) Goodhew, Richard (GEC-Marconi Materials Technology, England, UK) Beanland
Taylor & Francis Ltd, 2000
133,50 €On orderDelivery: 2-3 weeks
A guide to scanning and transmission microscopes and to the analytical techniques based on them. It covers the techniques of electron energy loss spectroscopy and energy dispersive X-ray analysis. It compares electron microscopic techniques to many of the competing physical investigative techniques available.
- ISBN-13
- 9780748409686
- ISBN-10
- 0748409688
- Publisher
- Taylor & Francis Ltd
- Year
- 2000
- Publication date
- 2000-11-30
- Pages
- 264
- Dimensions
- 157x236x16
- Weight
- 420