Characterization of High Tc Materials and Devices by Electron Microscopy
Cambridge University Press, 2000
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This is a clear account of the application of electron-based microscopies to the study of high-Tc superconductors. Written by leading experts, it provides a comprehensive review of scanning electron microscopy, transmission electron microscopy and scanning transmission electron microscopy, together with details of each technique and its applications.
- ISBN-13
- 9780521554909
- ISBN-10
- 052155490X
- Publisher
- Cambridge University Press
- Year
- 2000
- Publication date
- 2000-07-06
- Pages
- 406
- Dimensions
- 177x251x32
- Weight
- 864