Reflection Electron Microscopy and Spectroscopy for Surface Analysis
Zhong Lin (Georgia Institute of Technology) Wang
Cambridge University Press, 1996
199,75 €On orderDelivery: 2-3 weeks
Entirely self-contained, this book serves as a comprehensive source for graduate students and working scientists using electron microscopy and spectrometry techniques for surface studies. The text is written to combine basic techniques with special applications, theories with experiments giving a complete coverage of RHEED and REM.
- ISBN-13
- 9780521482660
- ISBN-10
- 0521482666
- Publisher
- Cambridge University Press
- Year
- 1996
- Publication date
- 1996-05-23
- Pages
- 458
- Dimensions
- 244x170x25
- Weight
- 1097