Photo-induced Defects in Semiconductors
David (Stanford University, California) Redfield, Richard H. (Stanford University, California) Bube
Cambridge University Press, 2006
87,25 €On orderDelivery: 2-3 weeks
This is the first book to give a complete overview of the properties of deep-level, localized defects in semiconductors. These metastable defects exhibit complex interactions with the surrounding material, and can significantly affect the performance and stability of certain semiconductor devices.
- ISBN-13
- 9780521024457
- ISBN-10
- 0521024455
- Publisher
- Cambridge University Press
- Year
- 2006
- Publication date
- 2006-03-09
- Pages
- 232
- Dimensions
- 229x152x14
- Weight
- 350